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09 Oct 2017

Toward System-Level Test

Ed Sperling, Semiconductor Engineering

Toward System-Level Test

What's working in test, what isn't, and where the holes are.

The push toward more complex integration in chips, advanced packaging, and the use of those chips for new applications is turning the test world upside down.

Most people think of test as a single operation that is performed during manufacturing. In reality it is a portfolio of separate operations, and the number of tests required is growing as designs become more heterogeneous and as they are used in markets such as automotive and industrial markets where chips are expected to last 10 to 20 years.

Posted in Electrical & Electronics

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